A3  Measurement of Materials and EM Fields

Thursday, January 4  13:20-14:40  Room 105

Session Chairs:  Jeanne Quimby, Steven Weiss

13:20  A3-1  UNCERTAINTIES IN RF ELECTRIC FIELD METROLOGY BASED ON RYDBERG ATOM SPECTROSCOPY

Matt T. Simons*1, Marcus D. Kautz1, Joshua A. Gordon1, David A. Anderson2, Georg Raithel2,3, Christopher L. Holloway1

1CTL, NIST, Boulder, CO
2Rydberg Technologies, Ann Arbor, MI
3Physics, University of Michigan, Ann Arbor, MI


13:40  A3-2  PRECISION PORTABLE CRYOGENIC BLACKBODY TARGET FOR MICROWAVE/MILLIMETER WAVE RECEIVER CALIBRATION

Fredrick S. Solheim*

Dakota Ridge R & D, Boulder CO


14:00  A3-3  SPATIAL K-MEANS CLUSTERING OF HF NOISE TRENDS IN SOUTHERN CALIFORNIA WATERS

Kristopher R. Buchanan*, Daniel Gaytan, Lu Xu, Chris Dilay, David Hilton

Electromagnetics Technology Branch, Space and Naval Warfare Systems Center Pacific (SSC Pacific), San Diego CA


14:20  A3-4  NONDESTRUCTIVE ELECTRICAL PROPERTY MEASUREMENTS BY MULTIREFLECT THRU TO 110GHZ

Nina B. Popovic*1,2, Jasper A. Drisko1, Sean E. Shaheen2, Edward Garboczi1, Chris J. Long1, Nathan D. Orloff1

1CTL, National Institute of Standards and Technology, Boulder, CO
2Electrical Engineering, University of Colorado at Boulder, Boulder,CO