13:20  A2-1  TIME-FREQUENCY ANALYSIS OF THE SCATTERED SIGNAL FROM CHIPLESS RFID TAGS

Reza Rezaiesarlak*, Majid Manteghi

Virginia Tech, Blacksburg, VA

13:40  A2-2  TESTING TELECOMMUNICATIONS DEVICES IN REVERBERATION CHAMBERS USING BROADBAND SIGNALS

Jason B. Coder*¹, John M. Ladbury¹, David Hunter²

¹Electromagnetics Division, National Institute of Standards and Technology, Boulder, CO
²CableLabs, Louisville, CO

14:00  A2-3  EFFECTS OF LTE SIGNALS ON CABLE TV DEVICES

David F. Hunter*¹, Jason B. Coder², John Ladbury²

¹CableLabs, Louisville, CO
²RF Fields Group, National Institute of Standards and Technology, Boulder, CO

14:20  A2-4  RANDOM COUPLING MODEL FOR WIRELESS COMMUNICATION SYSTEMS

Gabriele Gradoni*¹, Thomas M. Antonsen², Steven M. Anlage³, Edward Ott²

¹School of Mathematical Sciences, University of Nottingham, Nottingham, UNITED KINGDOM
²Institute for Research in Electronics and Applied Physics, University of Maryland, College Park, MD
³Center for Nanophysics and Advanced Materials, University of Maryland, College Park, MD

14:40  A2-5  REFLECTIVITY OF ROUGH COPPER SURFACES AT SUBMILLIMETER WAVELENGTHS

M. P. Kirley*, John H. Booske

Electrical and Computer Engineering, University of Wisconsin-Madison, Madison, WI

15:20  A2-6  NON-CONTACT PROBES FOR ON-WAFER CHARACTERIZATION OF THZ DEVICES AND INTEGRATED CIRCUITS

Cosan Caglayan*, Georgios C. Trichopoulos, Kubilay Sertel

ElectroScience Laboratory, Electrical and Computer Engineering Department, The Ohio State University, Columbus OH

15:40  A2-7  TIME-DOMAIN TERAHERTZ IMAGING AND SPECTROSCOPY OF X-RAY BLOCKING AND SCATTERING COATINGS

Nathan M. Burford*, Magda O. El-Shenawee

Electrical Engineering, University of Arkansas, Fayetteville, AR