A2  Reverberation Chamber Measurements

Thursday, January 10  13:20-16:40  Room 105

Session Chairs:  Christopher Holloway, John Ladbury

13:20  A2-1  RATIONALE FOR REVERBERATION CHAMBER TESTING

Vignesh Rajamani*1, Charles F. Bunting1, Gustav J. Freyer2

1ECEN, Oklahoma State University, Stillwater, OK
2GJF Consulting, Monument, CO


13:40  A2-2  UTILIZING REVERBERATION CHAMBERS AS A VERSATILE TEST ENVIRONMENT FOR ASSESSING THE PERFORMANCE OF COMPONENTS AND SYSTEMS

Dennis M. Lewis*

Metrology, Boeing, Seattle, Washington


14:00  A2-3  AN INVESTIGATION ON THE CORRELATION-COEFFICIENT AND POWER METRICS FOR MIMO ANTENNAS IN A REVERBERATION CHAMBER

Nick Janssen1, William F. Young*2, Christopher L. Holloway2, Kate A. Remley2

1Electromagnetics, TU/e, Eindhoven, Netherlands
2Electromagnetics, NIST, Boulder


14:20  A2-4  EFFECTS OF ANTENNA PROXIMITY ON RECEIVED-POWER MEASUREMENTS OF LARGE-FORM-FACTOR WIRELESS DEVICES IN REVERBERATION CHAMBERS

Kate A. Remley*1, Willem Burger2, Christopher L. Holloway1

1Electromagnetics Division, NIST, Boulder, CO
2Faculty of Electrical Engineering, Technical University Eindhoven, Eindhoven, The Netherlands


14:40  A2-5  PREDICTING AND CORRECTING FOR ANTENNA IMPERFECTIONS IN REVERBERATION CHAMBER MEASUREMENTS

John M. Ladbury*, Jason B. Coder

National Institute of Standards and Technology, Boulder, CO


15:20  A2-6  A LOWER BOUND OF ANTENNA EFFICIENCY BASED ON THE TWO-PORT MODEL: HOW CLOSE IS IT?

Jason Coder*1, Mark Golkowski2, John Ladbury1

1RF Fields, National Institute of Standards and Technology, Boulder, CO
2Electrical Engineering, University of Colorado Denver, Denver, CO


15:40  A2-7  BACKSCATTER COEFFICIENT MEASUREMENTS FOR REVERBERATION CHAMBER CHARACTERIZATION

Colton R. Dunlap*1,2, Christopher L. Holloway1, Edward F. Kuester2, John Ladbury1

1Electromagnetics Division, National Institute of Standards and Technology, Boulder
2Electrical Computer and Energy Engineering Department, University of Colorado at Boulder, Boulder


16:00  A2-8  INTERCONNECTION OF COMPLEX CAVITIES ANALYZED BY THE RANDOM COUPLING MODEL

Gabriele Gradoni*1, Thomas M. Antonsen1, Steven M. Anlage2, Edward Ott1

1Institute for Research in Electronics and Applied Physics, University of Maryland, College Park, MD
2Center for Nanophysics and Advanced Materials, University of Maryland, College Park, MD


16:20  A2-9  THE POWER DELAY PROFILE VERSUS EIGENVALUE DISTRIBUTION OF RESONANT ELECTROMAGNETIC ENVIRONMENTS

John Galbraith*

Los Alamos National Lab, Los Alamos, NM