|
1:15 |
Opening Remarks |
|
34.1 |
1:20 |
EMI Coupling To Cable Bundles "J. Pincenti, P. Uslenghi, University of Illinois at Chicago, USA" |
|
34.2 |
1:40 |
Coupling Among Multi-Conductor Transmission Lines and Complex Structures "Y. Bayram, The Ohio State University, T. Ozdemir, University of Michigan, J. L. Volakis, The Ohio State University, USA" |
|
34.3 |
2:00 |
"Analytical Formulas and Integral Equation Methods: a Study of Penetration, Radiation, and Scattering for a Slotted Semielliptical Channel Filled with" "D. Erricolo, University of Illinois at Chicago, M. Lockard, C. Butler, Clemson University, P. Uslenghi, University of Illinois at Chicago, USA" |
|
34.4 |
2:20 |
Exact Analysis of a 3D Cavity-backed Aperture with an Isorefractive Lens "C. Berardi, D. Erricolo, P. Uslenghi, University of Illinois at Chicago, USA" |
|
34.5 |
2:40 |
Broadband Antenna System for Uniform Field Generation "J. Brunett, V. Liepa, University of Michigan, USA" |
|
34.6 |
3:00 |
Plane Wave Illumination Effects onto Circuit Topologies "E.S. Siah, J. L. Volakis, D. Pavlidis, V. V. Liepa, The University of Michigan, USA" |
|
34.7 |
3:20 |
Conducting EMI Effects on RF Active Circuits "H. Yang, University of Illinois at Chicago, USA" |
|
34.8 |
3:40 |
An Improved Fast Algorithm for Transient Simulation of Microwave Circuits with Nonlinear Electronics "J. Meng, K. Aygun, E. Michielssen, University of Illinois at Urbana-Champaign, USA" |
|
34.9 |
4:00 |
A Hybrid Methodology for Efficient Electromagnetic Interference Modeling of High-density Printed Circuit Board "J. Morsey, M. Choi, V. Okhmatovski, A. Cangellaris, University of Illinois at Urbana-Champaign, USA" |
|
34.10 |
4:20 |
"Design and Simulation of an EM-Fault-Tolerant Processor with Micro-Rollback, Control-Flow Checking and ECC" "F. Trovo, S. Dutt, H. Arslan, University of Illinois at Chicago, USA" |
|
34.11 |
4:40 |
Functional and Communications Theory Models in Susceptibility Analysis "I. Kohlberg, Institute for Defense Analyses, R. Gardner, DOD Consultant, USA" |
|
34.12 |
5:00 |
Engineering Trades for Combining Coupling Models and Empirical Effects Data in Susceptibility Analysis "R. Gardner, DOD Consultant, I. Kohlberg, Institute for Defense Analyses, C. Ropiak, Envisioneering, Inc., USA" |